CMM capabilities can be expanded with additional tools.
In a perfect world, or in a fully integrated manufacturing environment, metrology systems would be able to measure all necessary parameters in one pass, without error, and feed back results seamlessly to computer-integrated manufacturing networks, in the formats most useful for machine control and process management.

Prior to the introduction of automated image-analysis systems, lab operators often had to rely on expensive film-based methods of documenting and analyzing images.

Optically scanning an entire surface takes into account surface information that is often overlooked by traditional methods.

Today’s microscopes have more capabilities and features to meet manufacturing demands.

Gage interfaces allow the data collected from several manufacturers' gages to be manipulated and used together.