Speakers from Advantech and partners Intel, Micron, NVIDIA and DataCore will present the newest industrial IoT, automation and AI technologies and trends.
We frequently calibrate gages and instruments in the dimensional field for labs that primarily deal with electronic or other disciplines. This occurs when their customers try to cut corners by adding one or more dimensional items onto an order they have received for their normal work.
There are a variety of ways to perform automated, high precision measurement, each with its own strengths. Contact measurement is more effective for measuring specific features—holes for example—to ensure that they are where they belong and of the correct shape and size.
This x-ray fluorescence (XRF) instrument expands the MicroConnex metrology capability set to include best-in-class thickness and composition measurements of very thin metal coatings, conductive traces, and small components and structures.