The CT-Gage DL+ thickness gage offers an A-Scanning display, which allows the operator to see the signal and adjust all gates and parameters while testing, giving full transparency to the operator in the application environment.
The JSM-7600F is a thermal field emission (FEG) scanning electron microscope (SEM) that integrates a semi-in-lens objective lens with an in-lens thermal electron gun.
The PX Series photoelectric sensors have heads that carry an IP69K environmental rating, allowing them to be subjected to high pressure-1,400 pounds per square inch (psi)-washdown applications.