Recent advances in scanning electron microscopy (SEM), particularly in the benchtop realm, enhance quality control procedures of laboratories across a wide range of industries.
The new materials microscope Leica DM2700 M from Leica Microsystems is ideal for all kinds of routine inspection tasks in metallography, earth science, forensic investigation, and materials quality control and research.
Effective Nov. 3, 2012, Leica Microsystems’ industrial and microscopy customers should contact Vashaw Scientific for all sales and service related issues in Florida.
The VK-9700 color 3-D laser scanning confocal microscope combines the capabilities of scanning electron microscopes (SEMs) and noncontact profilometry with the ease of use of a conventional microscope.
