As the event hosts, the Zwick Roell Group invites you to meet the experts in materials testing at this year's testXpo 2010. Held from 11-14 October at the Zwick facility
GAITHERSBURG, MD-The National Institute of Standards and Technology (NIST) Hollings Manufacturing Extension Partnership (MEP) has awarded a grant of $1.5 million over 3 years to the Delaware Valley Industrial Resources
AKRON, OH-Applied Vision Corp., the leading provider of machine vision inspection systems for the container manufacturing industry, has expanded its global customer service and support network with the opening of
WASHINGTON-The American National Standards Institute (ANSI), coordinator of the U.S. standards and conformity assessment system, announced the launch of a new pilot accreditation program for certification bodies that seek recognition
LISLE, IL- Praveen Gupta, Adjunct Industry Professor for Business Innovation and Co-Chair for the 3rd annual Business Innovation Conference 2010 being held at Illinois Institute of Technology's Rice Campus in
PORTLAND, OR-Schmitt Industries Inc. announced that it will be exhibiting the company's newest product line, the Lasercheck line of surface roughness measurement gauges at the IMTS show September 13th-18th in
Key Technology announces the appointment of Jeff Nickerson as product marketing manager. Nickerson is responsible for marketing all of Key's product lines, which includes world-class automated inspection, specialized conveying, and
MENLO PARK, CA-Tyzx, the 3D vision technology company, announced that iRobot Corp. has chosen the Tyzx DeepSea G3 Embedded Vision System (EVS) to provide real-time vision and depth perception for
SOUTHINGTON, CT-For machine vision applications requiring high speed and high resolutions, Baumer has introduced its new SXG Dual GigE Cameras that are capable of transferring data as fast as 240
W. CONSHOHOCKEN, PA-X-ray diffraction has become a popular means of residual stress measurement in the aerospace materials field over the last 50 years. A proposed new guide being developed by