Zontec Inc. announced a new Synergy SPC software validation service to its customers.

Fluke Corporation expands the CNX™ Wireless Test Tools system to include the Fluke® Ti1XX Series Thermal Imagers, enabling users to troubleshoot even more problems than before.

Specialty Motions, Inc. (SMI) has developed a simple but elegant method for measuring long-length materials such as linear shafting, carbon fiber tubing, wire cables or long sheets of wood, metal, cording or plastic in a variety of diameters and shapes.

A non-contact linear measurement sensor with a wide range of available outputs has been introduced by Solartron Metrology, a unit of AMETEK, Inc.

Aerotech’s ANT-L-Z crossed-roller, Z-axis, nanopositioning stages combine speed, accuracy, resolution, repeatability, reliability and size. They are offered in two models (ANT95-L-Z and ANT130-L-Z) and two accuracy grades.

Brunson Instrument Company announced their new line of Target Holder Kits, available in inch and metric collections.

The new materials microscope Leica DM2700 M from Leica Microsystems is ideal for all kinds of routine inspection tasks in metallography, earth science, forensic investigation, and materials quality control and research.

Thermo Fisher Scientific Inc. announced an affordable, yet sophisticated and easy-to-use X-ray detection platform, designed to enable food processors to meet the global demand for more thorough inspection for product contamination.

Rudolph Technologies, Inc. announced the release of the S3000SX™ thin film metrology system for transparent films in advanced semiconductor fabrication applications at the 28nm node and below.