The Epoch 1000 Series of digital ultra­sonic flaw detectors includes the Epoch 1000, Epoch 1000iR and Epoch 1000i.

The DRA-EV-300 is a diffuse reflectance accessory designed for use with the company’s spectrophotometer in material science and general quality control measurements on solid materials.

The Thick-800 X-ray fluorescence (XRF) analyzer measures plating thickness and provides measurements of single-layer, multi-layer and thin-film coatings and solders with composition.

The EZ Scan is a linear axis encoder for use with the company’s ultrasonic thickness gage.

The Spectroline Optimax 365 is a cordless, rechargeable true UV-A LED flashlight for nondestructive testing applications.

The QualiScope II is a handheld automatic Brinell measurement system designed to make testing programs faster and more accurate.

VT-X Series X-ray inspection shortens the tact time for in-line, post-solder inspection of printed circuit boards (PCBs).

Digital zoom microscope systems are available with magnification capabilities of up to 7,000X.

R7D-B Series servo drives have real-time auto-tuning and adaptive vibration suppression to shorten startup time to achieve reliable performance.

The Focal Spot Analyzer measures focus spot characteristics of high-power lasers in real time.