New 3D Parameters and Filtration Techniques for Surface Metrology

For a long time surface metrology has been based upon measurement using 2D profilometers. Over the past twenty years the appearance of 3D profilometers and non-contact gauges has created a need for the standardization and formalization of the analysis of 3D surface texture. This paper presents the current status of the standardization process and includes a short description of the tools and parameters that will become available to users when work on the definition of the new standards, which is being carried out by working groups WG15 and WG16 of ISO technical committee TC213, has been completed.

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Title: New 3D Parameters and Filtration Techniques for Surface Metrology
Company: Digital Surf
Website: www.digitalsurf.fr/en/index.html
Date: 2006
Format: PDF
Topic(s): Featured White Paper

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Francois Blateyron is R&D director at Digital Surf, where he has been developing surface metrology solutions since 1992. He is one of the French experts on ISO technical committee TC213 and is an active member of work group WG16, responsible for defining the new standard for 3D surface texture, and work grou WG15, responsible for new filtration techniques.