VIEW Ultra-High Performance Metrology System

VIEW Pinnacle ultra-high performance measuring system exhibited at IMTS 2016 is ideal for measuring micro-parts. It is geared to the unique requirements posed by very small feature sizes and designed to deliver the highest levels of accuracy, throughput, functionality, and reliability.

VIEW MICRO-METROLOGY
WWW.VIEWMM.COM
BOOTH E-5602

KEYWORDS: metrology systems View

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