The event will focus on the industrial applications of AM for making functional components and end-use production parts. Attendees will gain practical knowledge on AM adoption and implementation and can network with AM industry leaders.
The presentation will discuss Walk-Up Metrology—the capability and utilization of a vision and multi-sensor system to be effective for a wide range of measurement applications.
Held Sept. 10-15 at Chicago's McCormick Place, the AM resources at IMTS include the Additive Manufacturing Pavilion and a second AMT's Emerging Technology Center focused strictly on additive manufacturing, both located at the entrance to the West Building in an expanded exhibit space.
The 34th annual metrology conference takes place July 24-25 in Reno, NV
July 20, 2018
The course is a first-of-its-kind, condensed preparatory course designed to assist and inform students in the topics covered within the Coordinate Measurement Society’s (CMS) Level-One Certification for 3D Metrology.
The event will present the company’s latest advancements in static, dynamic, and impact testing for the biomedical field, including live demonstrations on how to improve efficiency in the lab, ways to expand capabilities, and how to deliver more accurate and reliable test results. Seating is limited.