We all know small, round, low-density components are great for X-ray CT, but what do you do when the samples are not so X-ray CT-friendly? How do you still achieve quality, high-resolution scan results on products such as large circuit boards or other planar, flat, and high aspect ratio components?
Join our webinar on Wednesday, April 3rd, to learn about a new and innovative X-ray computed tomography scanning approach called Tilted CT. This method can increase magnification and resolution while reducing artifacts when imaging challenging components.
In this webinar, we will explain how Tilted CT utilizes proven laminography principles using an angled axis of rotation to achieve superior results over Traditional Circular CT. We will showcase scan applications demonstrating how Tilted CT can help users discover more details with greater confidence.
Learning Objectives:
- Identify solutions for imaging challenges with non-X-ray CT-friendly samples, such as large circuit boards.
- Understand the key features of Tilted CT and its role in achieving high-resolution scans for planar, flat, and high aspect ratio components.
- Recognize the advantages of Tilted CT, including increased magnification, improved resolution, and reduced artifacts in imaging challenging components.
- Gain insights into the superior results of Tilted CT over Traditional Circular CT through showcased scan applications, demonstrating enhanced detail discovery with increased confidence.
Sponsored by:
