Thin-film analysis | Quality Magazine

Items Tagged with 'Thin-film analysis'

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Thickness Measurement Software

December 5, 2014

CRAIC Technologies introduced CRAIC FilmPro film thickness measurement software.

Amber Czajkowski, Edmund Optics Engineer, Selected for Inclusion in the SPIE 2013 Women in Optics Planner

April 19, 2013

Edmunds Optics (EO) announces Amber Czajkowski, Thin-Film Engineer, will be featured in the SPIE 2013 Women in Optics Planner.

Previously known as Informa Markets Engineering (IME) West, hosting five co-located shows — MD&M West, ATX West, D&M West, Plastec West, and WestPack — we are now merging 4 of these related industry sectors into a single unified show: MD&M West.

Our special focus on your specialty is not changing. One MD&M umbrella unites a community of multiple special interests who all share a single goal – to advance their knowledge, contacts, and progress in the rapidly accelerating world of advanced manufacturing.

Items Tagged with 'Thin-film analysis'

ARTICLES

Thickness Measurement Software

Amber Czajkowski, Edmund Optics Engineer, Selected for Inclusion in the SPIE 2013 Women in Optics Planner

Stay in the know with Quality’s comprehensive coverage of
the manufacturing and metrology industries.

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Items Tagged with 'Thin-film analysis'

ARTICLES

Stay in the know with Quality’s comprehensive coverage ofthe manufacturing and metrology industries.

eNewsletter | Website | eMagazine

Stay in the know with Quality’s comprehensive coverage of
the manufacturing and metrology industries.