Items Tagged with 'scanning electron microscopy (SEM)'

Electron backscattered diffraction (EBSD) is a technique for determining the near surface crystallographic and microstructural properties of a material. 

Recent advances in scanning electron microscopy (SEM), particularly in the benchtop realm, enhance quality control procedures of laboratories across a wide range of industries.

The JSM-7600F is a thermal field emission (FEG) scanning electron microscope (SEM) that integrates a semi-in-lens objective lens with an in-lens thermal electron gun.