EDAX, Inc. has introduced new APEX Analysis software for its Element SDD silicon drift detector for tabletop scanning electron microscopes (SEMs), a product line focused on serving the needs of the industrial market.

The Scanning Electron Microscope (SEM) is widely used in various fields of industry and science because it is one of the most versatile imaging and measurement instruments. SEMs allow users to see details 1,000 times smaller than a conventional microscope.