Sophisticated Metrology on a Budget Buying the most economical system that meets your needs just makes sense, and finding that system need not be complicated. David Wick December 2, 2014 There’s a place in the world for high-priced, top-of-the line systems, and there are applications for which nothing else will do.Read More
Keep Pace With the Smart Factories of Tomorrow Are CMM vendors ready for changing dynamics of end users? Aravind Govindan December 2, 2014 The manufacturing world is at the brink of transformation, with smart factories and emphasis on automation coming to the fore. Read More
INDUSTRY HEADLINE ISO 9001 Revision Moves on to Final Stage November 6, 2014 The new edition, expected in 2015, will feature some important changes. Read More
INDUSTRY HEADLINE Howard Harary Appointed Director of NIST Engineering Lab November 6, 2014 A physicist turned measurement scientist, Harary began at NIST in 1985 as a bench scientist.Read More
Deep Thinking About Depth Gages Like other hand tools, depth gages have undergone a gradual change from mechanical scales to digital wonders. George Schuetz November 3, 2014 Depth gages are among the simplest of gages, typically consisting of an indicating device mounted through a reference bar or plate.Read More
NDT HEADLINE Laser Design, Rx Solutions Announce North American Distribution Partnership October 10, 2014 CT scanners are a solution to the problem of inspecting internal and external surfaces of a part without having to cut them open or otherwise destroy them.Read More
A New Paradigm for Multisensor Metrology With so many tools, it’s not work—it’s fun. Kenneth L. Sheehan October 2, 2014 Imagine having a complete toolbox in your garage—one of those big red rolling toolboxes with drawers and compartments everywhere. Read More
Maximizing Data Recovery Utilizing 3-D digital laser microscopy to image damaged optical media. Greg Gogolin James Jones Derek Brower October 2, 2014 Utilizing 3-D digital laser microscopy to image damaged optical media.Read More
INDUSTRY HEADLINE Jeff Andreson Joins Nanometrics as Chief Financial Officer September 29, 2014 Andreson brings 30 years of finance experience in the capital equipment industry.Read More
A Recap of IMTS 2014 September 17, 2014 The 30th edition of IMTS was the fourth largest in IMTS history and the largest six-day show ever.Read More