Hexagon’s Manufacturing Intelligence division launched a brand-new laser tracker line, the Leica Absolute Tracker ATS600. This new product introduces a new concept in metrology-grade laser trackers, with targetless 3D scanning possible for the first time directly from the laser tracker.

Exact Metrology announced the availability of its Artec LEO 3D scanner, the first scanner to offer onboard automatic processing with an integrated touch panel viewer. This frees users from being tied to a computer for data capture.

Hexagon’s Manufacturing Intelligence division launched DPA Industrial, featuring the new C1 Camera in combination with the well-established AICON DPA Series photogrammetry measurement system.

In the early 17th century, Galileo Galilei discovered that he could focus his telescope to examine small objects up close. Around 1620, it is believed that Cornelius Drebbel invented the compound microscope. In the 1670s, Antonie van Leeuwenhoek began experimenting with very high-magnification, single-lensed microscopes that he designed himself. 

I have received a couple of emails from readers recently concerning what does or does not have to be calibrated within a quality system. In both cases, the companies already have a program in place to ensure their measuring equipment, masters, etc., are calibrated on a regular basis but an odd item has popped up leading to debate within the company on whether that odd item has to be included in their calibration program as well.

Fluke Calibration introduces the 5322A Electrical Tester Calibrator, a multi-device calibrator built to facilitate compliance with exacting international standards such as the United Kingdom’s BS7671 17th Edition, IEC/EN Standards, Australia and New Zealand’s AS/NZS 3000 and Chinese verification/calibration regulations for various electrical testers.

In industries like consumer electronics, battery, and solar, the race for ever faster scanning, measurement, and control is critical to delivering 100% inspection of small parts moving at production speed.