Jeff Bibee

Jeff Bibee is a sales manager at Werth Inc. (Old Saybrook, CT). For more information, call (860) 399-244, email [email protected] or visit www.werthinc.com.

Articles

ARTICLES

ComputedTomography_FT

Multi-Sensor Metrology with X-ray Computed Tomography

X-ray computed tomography is an appropriate technology for complete acquisition of components without part preparation or destruction.
Jeff Bibee
June 9, 2015

Inspection is a critical element of any product development. In addition to dimensional inspection, evaluating products increasingly involves the inspection of free-form surfaces that are not relevant to the function.


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ComputedTomography_FT

Multi-Sensor Metrology with X-ray Computed Tomography

X-ray computed tomography is an appropriate technology for complete acquisition of components without part preparation or destruction.
Jeff Bibee
June 4, 2014

Inspection is a critical element of any product development. In addition to dimensional inspection, evaluating products increasingly involves the inspection of free-form surfaces that are not relevant to the function.


Read More

QUALITY MEASUREMENT: Measure Completely and Accurately

Jeff Bibee
December 1, 2006
Inspection is a critical element of any quality program. In addition to the dimensional inspection of workpiece functional elements-typically with tight tolerances-evaluating products increasingly involves the inspection of free-form surfaces that are not relevant to the function.
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