High Slope Metrology with Non-Contact Interferometry Coherence Scanning Interferometry technology has a number of advantages over traditional contact surface measurement techniques. Michael Schmidt Nate Gilfoy, PH.D Martin Fay, PH.D July 1, 2014 Optical profilers using Coherence Scanning Interferometry (CSI) are used in manufacturing to obtain information about both a part’s surface and its gross form.Read More
