Benoit Lepage began actively working in the NDT domain in 2000 as an RDTech employee. He contributed to numerous innovation in the field through product based innovations and patents (nine granted patent as first inventor) in eddy current array, phased array and guided wave methods.
The total focusing method (TFM) is a synthetic aperture beam forming technique that has been under active development in the NDT industry over the past decade.
In this paper, we introduce a newly developed semi-analytical model to predict the total focusing method (TFM) amplitude sensitivity map for both nondirectional and directional flaws.
