Articles Tagged with ''nondestructive testing''

From e-vehicles to consumer electronics and implantable medical devices, standards and expectations for the quality and reliability of sealed devices and components continue to rise. This puts the burden on manufacturers to employ methods of leak testing that are objective, reliable and repeatable.

Nondestructive testing (NDT) encompasses a variety of test and inspection procedures that are used to find defects or inconsistencies in test samples without compromising the integrity of the parts.

Coordinate measuring machines (CMMs), vision systems, the trusty micrometer—no manufacturer would argue the importance of traditional dimensional metrology equipment, but the fact remains that the tried and true sometimes comes up lacking.

Additive manufacturing has moved far beyond its prototyping roots. Today, additive for production applications is a growing area of interest.

When we talk to customers who are interested in learning more about XRF, there are some questions that we answer all the time. Check out some of the most frequently asked questions and their answers below.

As developments in machine learning and the Internet of Things (IoT) impact how manufacturers run their businesses, automation can support these changes and boost productivity.

Electroless nickel (EN) is industry’s most common plated finish. It’s widely used for applications that demand wear resistance, hardness and corrosion protection—particularly if parts have complex geometries. It is also used in PCB manufacturing within a process known as ENIG, electroless nickel immersion gold. 

Eddy current testing (ECT) is an electromagnetic testing technique used to inspect non-ferromagnetic materials, and eddy current array (ECA) is an advanced form of ECT that allows efficient scanning over larger areas. 

Production leak testing can mean a lot of different things, and if you are not familiar with this branch of nondestructive testing, the choices of methodologies and techniques can seem a bit daunting.

In this paper, we introduce a newly developed semi-analytical model to predict the total focusing method (TFM) amplitude sensitivity map for both nondirectional and directional flaws.